微电子靠得住性 SCIE

期刊简介估计审稿时候： 较快,2-4周 约8.3周

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.

Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

《微电子靠得住性》努力于传布微电子装备、电路和系统靠得住性的最新研讨功效和相干信息，涵盖资料、工艺和制作、设想、测试和操纵等各个方面。该期刊涵盖以下主题：丈量、懂得和阐发；评估和展望；建模和仿真；体例和减缓。将靠得住性与微电子工程其余主要范畴（如设想、制作、集成、测试和现场操纵）相连系的论文也将遭到接待，并且出格鼓动勉励报告该范畴和特定利用范畴案例研讨的理论论文。

大大都被接管的论文将以研讨论文的情势颁发，描写严重停顿和已实现的任务。回首遍及感乐趣的主要成长主题的论文可以或许会被接管作为批评论文颁发。更开端的告急通信和对于以后感乐趣的已实现理论任务的冗长报告可以或许会被斟酌作为研讨条记颁发。一切投稿均需颠末该范畴顶尖专家的同业评审。

《Microelectronics Reliability》(微电子靠得住性)编辑部通信体例为PERGAMON-ELSEVIER SCIENCE LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB。若是您须要辅佐投稿或润稿办事，您可以或许征询咱们的客服教员。咱们专一于期刊征询办事十年，熟习颁发政策，可为您供给一对一投稿指点，防止您在投稿时频仍碰鼻，节流您的可贵时候，有用晋升颁发机率，确保SCI检索（检索不了全额退款）。咱们视诺言为生命，多方面确保文章宁静失密，在任何环境下都不会泄漏您的小我信息或稿件内容。